The URA-100 ultra-broadband device response analyzer integrates the testing functionality for typical photonic and RF parts, and has both frequency domain response measurement and time domain response analysis functions, with a measurement frequency range of up to 140GHz.

 

It can be used for the measurement of bandwidth, amplitude-frequency/phase-frequency response, time domain response of common optoelectronic and RF chips, devices and modules, such as electro-optical intensity modulators, directly modulated lasers, photodiodes, and photodetectors in the optical communication band as well as passive microwave devices, providing testing capabilities from chip inspection to system quality control, quality inspection, process development, and high-performance chip and device research in universities and research institutes. We provide a series of probe products of different types and bandwidths. Based on the testing needs of the users, a right selection of probes along with the URA-100 analyzer mainframe can build the most economical measurement system solution that matches the user's testing needs and budget. Relying on an instrument platform with an ultra-high-bandwidth photonic core, the URA-100 series of products supports convenient system upgrades through probes and software options to meet users' ever-increasing testing capability requirements, and provides the most cost-effective and gapless system upgrade solution.

 

 

Large bandwidth:     110GHz continuous frequency response measurement range (up to 140 GHz for RF devices)

Fast measurement:  0.1s shortest full-band measurement time, support dynamic testing

Scalable:                    through optional probes to meet different frequency range requirements, low system performance upgrade cost

Easy to deploy:         ultra-low loss fiber-optic connection, no high-frequency cable restrictions, adapt to different applications from chips to modules

Easy to use:             full touch screen operation, simple measurement steps, easy to learn and use, equipped with USB and other standard interfaces

 

 

  

 

 

 

Test Instrument