The URA-100 ultra-broadband device response analyzer combines testing capability for common photonic and RF components, with frequency domain and time domain response analysis functionalities, with a measuring frequency range of up to 140GHz.
Common optoelectronic and radio frequency chips, devices, and modules, including electro-optical intensity modulators, directly modulated lasers, photodiodes, and photodetectors in the optical communication band, as well as passive microwave devices, can have their bandwidth, amplitude-frequency/phase-frequency response, and time domain response measured. Our solution offers testing capabilities for chip inspection, system quality control, quality inspection, process development, and high-performance chip and device research in academic institutions and research centers. Our range of probe items includes a variety of kinds and bandwidths. Depending on the users' testing requirements, the most cost-effective measurement system solution may be constructed using the URA-100 analyzer mainframe and the appropriate probe selection. The URA-100 series of products supports easy system upgrades through probes and software options to satisfy users' ever-increasing testing capability requirements. It is based on an instrument platform with an ultra-high-bandwidth photonic core and offers the most affordable and seamless system upgrade solution.
Large bandwidth: 110GHz continuous frequency response measuring range (up to 140GHz for RF devices)
Fast measurement: 0.1s shortest full-band measuring time; supports dynamic testing
Scalable: With various probes to fulfill varying frequency range needs, reasonably priced system performance upgrading cost
Easy to deploy: Ultra-low loss fiber-optic connection, no high-frequency cable limits, adapt to varied applications from chips to modules
Easy to use: User-friendly features include a complete touch screen, straightforward measuring instructions, USB connectivity, and other common interfaces.
Test Instrument