Our novel ultra-broadband device measurement solution is suitable for different test scenarios from chips, devices and modules:

1. Typical measurement of photonic devices: photodetectors, electro-optic modulators, silicon optical modulators, direct-modulated lasers, etc.

2. Typical measurement of RF devices: high-frequency cables, waveguides, filters, high-gain antennas, etc.

The novel photonic architecture not only makes the mainframe of the test system lighter, but also does not require bulky and expensive high-frequency RF cables to connect the broadband measurement probe to the mainframe of the instrument. It is suitable for a broader range of different application scenarios from academia to industrial production, and is convenient for fast and accurate broadband characterization.

We can provide users with bandwidth, frequency response and other testing services of user’s chips, devices and modules, as well as short-term rental of instruments and other services. Please contact us for your specific needs.

Typical Testing Results