Based on our core technology breakthroughs originated from more than ten years of fundamental scientific research and discovery, we have independently developed a fast test solution for large-bandwidth devices with a new architecture and high cost-effectiveness that can cover the frequency range of 110GHz and above.

The performance of high-speed optoelectronic and microwave chips and devices is rapidly improving. With the introduction of a new generation of high-speed communication standards, the industry and research community have increasingly urgent needs for the development and production of high-speed broadband devices. The most important and complex test part of the performance of related chips and devices is their broadband response characteristics, which directly affects the overall performance of the final module and system. However, the current broadband frequency response measurement system based on vector network analyzers is not only expensive, but also often out-paced by the device’s performance improvement. Other issues like complex high-frequency systems, bulky RF cables, and time-consuming test processes, also plague the development and production of corresponding high-end devices.

We have launched a unique benchtop broadband device response measurement instrument and related test solutions to the industry that adopts an ultra-high-bandwidth all-optical core architecture through the industrialization of scientific research innovations from our founding team. Due to the use of a broadband photonic core, our measurement method is completely different from the current test solution based on high-frequency RF instruments, and our new solution not only overcomes the shortcomings of broadband RF measurement systems such as high complexity, high price, and high power consumption, but also gives full play to the technical advantages of photonic technologies such as large bandwidth, low power consumption, and low crosstalk. Compared with the existing frequency response measurement system based on vector network analyzers, while the measurement bandwidth and speed are improved, the cost, power consumption, volume, and weight of the instrument are greatly reduced, and the advantages of ease of use and maintainability are outstanding, providing a broadband test solution with revolutionary cost-effective advantages for the research, development and production of high-end optoelectronic and RF chips, devices, and modules.

Advantages of Our Solution:

Ultra-high-bandwidth core - high system measurement bandwidth

Fully self-developed instruments - low fixed asset investment

Simple and fast measurement - low operating labor cost

Local service team - low after-sales maintenance cost