Based on our core technology breakthroughs from over ten years of fundamental scientific research and discovery, we have independently developed a fast test solution for large-bandwidth devices with a new architecture and high cost-effectiveness that can cover frequencies of 110GHz and higher.

The performance of high-speed optoelectronic and microwave chips and devices is continually increasing. With the advent of a new generation of high-speed communication standards, the business and research community have greater urgency in developing and producing high-speed broadband devices. The most essential and challenging aspect of testing the performance of these devices is their broadband response characteristics, which have a direct impact on the overall performance of the finished module and system. However, the existing frequency response measuring technique, which is based on vector network analyzers, is not only costly but frequently outpaced by device performance improvements. Other challenges, such as sophisticated and pricy instrument, clumsy RF connections, and time-consuming test procedures, impede the development and manufacture of high-end products.

We have introduced to the industry a one-of-a-kind benchtop broadband device response measuring equipment and related test solutions based on an ultra-high-bandwidth all-optical core architecture developed by our founding team's scientific research. Our measurement method differs significantly from the current test solution based on high-frequency RF instruments due to the use of a broadband photonic core, and our new solution not only overcomes the shortcomings of broadband RF measurement systems such as high complexity, high price, and high power consumption, but also fully exploits the technical advantages of photonic technologies such as large bandwidth, low power consumption, and low crosstalk. While the measurement speed and bandwidth are increased in comparison to the current frequency response measurement system based on vector network analyzers, the instrument's cost, power consumption, volume, and weight are significantly decreased, and its ease of use and maintainability are exceptional. This results in a broadband test solution that offers revolutionary cost-effective advantages for the development and manufacturing of high-end optoelectronic and radio frequency chips, devices, and modules.

Benefits to Our Customers of Our Solutions:

Ultra-high-bandwidth photonic core – High measurement bandwidth

Fully self-developed instruments – Low fixed asset investment

           Easy and quick measurement – Low labor costs for operations

                                    Local after-sales service team – Low maintenance cost